Image Processor Options
FocalSpot's line of easy-to-use X-Ray Imaging Workstations are used to perform x-ray inspection, nondestructive test (NDT), diagnostic radiology, failure analysis, manufacturing process validation and rework verification. The VIP Series provides advanced image-processing algorithms to assist with inspection analysis. The (3) three workstation / Image Processor options (below) were developed to address a broad spectrum of applications and budgetary requirements from: cost-effective essential tools to precision measurement, advanced analysis and automation tools. See:Features Table for more information.
NOTE: FocalSpot Image processors are suitable for upgrading any RS-170 video output capable x-ray inspection system, by providing extended image enhancement, measurement, analysis and reporting tools and PC-based functionality.
VIP Standard Workstation
VIP Plus Enhanced Workstation
VIPx Advanced Workstation
Standard X-Ray
Image Processor
VIP is a Windows™ based Standard Image Processing software that provides fundamental tools for x-ray image capture, file saving and printing, line measurement and sharpen filtering.
VIP Plus is a Windows™ based Enhanced Image Processing software that provides additional capabilities for BGA and void measurements, and analysis reporting.
VIPx provides a rich Windows™ based toolbox for image enhancement, filtering and analysis of PCBs, components and mechanical parts. VIPx delivers analytical (pass/fail) reporting based on user defined inspection criteria.
FocalSpot™ Image processors are suitable for upgrading any RS-170 video output capable x-ray inspection system, by providing extended image enhancement, measurement, analysis and
reporting tools and PC-based functionality.
Real-Time X-Ray Imaging Theory
Interpreting x-ray images in real-time radiography requires a basic understanding of x-ray theory and a trained eye to interpret faults as they appear in x-ray images.
The following presentation provides an overview of x-ray inspection theory.
This presentation provides an overview of applications, techniques and examples to assist with the understanding of faults as they appear in x-ray images.